Download e-book for kindle: Advanced Test Methods for SRAMs: Effective Solutions for by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge

By Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel

ISBN-10: 1441909370

ISBN-13: 9781441909374

ISBN-10: 1441909389

ISBN-13: 9781441909381

Advanced try out tools for SRAMs: powerful strategies for Dynamic Fault Detection in Nanoscaled Technologies

by:

Alberto Bosio

Luigi Dilillo

Patrick Girard

Serge Pravossoudovitch

Arnaud Virazel

Modern electronics is determined by nanoscaled applied sciences that current new demanding situations by way of trying out and analysis. stories are quite liable to defects because they take advantage of the know-how limits to get the top density. This booklet is a useful consultant to the checking out and analysis of the most recent iteration of SRAM, the most conventional kind of stories. Classical tools for trying out reminiscence are designed to address the so-called "static faults", yet those try out suggestions should not adequate for faults which are rising within the most modern Very Deep Sub-Micron (VDSM) applied sciences. those new faults, known as "dynamic faults", usually are not lined by means of classical algorithms and require the committed attempt and analysis ideas awarded during this book.

  • First booklet to give whole, cutting-edge insurance of dynamic fault trying out for SRAM memories;
  • Presents content material utilizing a "bottom-up" process, from the learn of motives of malfunctions as much as the new release of clever try out techniques;
  • Includes case experiences protecting all reminiscence elements (core-cells, deal with decoders, write drivers, experience amplifiers, etc.);
  • Proposes an exhaustive research of resistive-open defects in every one reminiscence part and the ensuing dynamic fault modeling.

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Extra info for Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Example text

2002). 6 Conclusion The aim of this chapter has been to first present an overview about the semiconductor memories and then to introduce the main issues related to SRAM testing. In the first part of the chapter, the basic structure of an SRAM has been introduced. In the second part, the basic notions of memory testing have been presented. In particular, fault models have been described using the fault primitive formalism. Based on this formalism, the taxonomy of dynamic faults as well as the state-of-the-art of existing test solutions has been discussed.

19. These two algorithms cover many fault models such as stuck-at faults, unlinked coupling faults, transition faults, and others. Their capability to detect DRFs is 44 Fig. 19 IFA-9 and IFA-13 test procedure 2 Resistive-Open Defects in Core-Cells {⇑ (w0) ⇑(r0, w1) ⇑(r1, w0) ⇓(r0, w1) ⇓ (r1, w0) Del ⇑(r0, w1) Del ⇑(r1)} IFA-9 {⇑ (w0) ⇑(r0, w1, r1) ⇑(r1, w0, r0) ⇓(r0, w1, r1) ⇓ (r1, w0, r0) Del ⇑(r0, w1) Del ⇑(r1)} IFA-13 related to the presence of delay periods (referred as Del) inserted after March elements that leave respectively logic ‘0’ and logic ‘1’ stored in all the core-cells of the array, for the coverage of symmetrically placed resistive-open defects.

4 Analysis and Test of dDRF Some resistive-open defects, which are placed in the refreshment loop of the corecell, may cause Data Retention Faults (DRFs). There are different forms of DRF depending on the location of the defect and its resistance value. In particular, two sub-cases of dDRFs can be identified and their sensitization can be done by using the RES principle, as seen before for the dRDFs, and by emphasizing natural noise phenomena in SRAMs such as the ground bounce (Dilillo et al. 2005a).

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel


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